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Rohde & Schwarz, Germany verifies NXP’s automotive radar sensor reference design
On December 22, Rohde & Schwarz announced that its radar target simulator R&S RTS has been used to verify the performance of NXP Semiconductors’ next-generation radar sensor reference design.
The new sensor reference design is based on a NXP’s 28 nm RFCMOS radar one-chip SoC (SAF85xx). The R&S RTS radar test system c....
The new sensor reference design is based on a NXP’s 28 nm RFCMOS radar one-chip SoC (SAF85xx). The R&S RTS radar test system c....
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